Book Chapters
“Refining Initial Points for K-Means Clustering” Paul Bradley, Usama Fayyad. ICML 1998, Pro. of the 15th International Conference on Machine Learning, pp. 91-99, Morgan Kaufmann, Madison, Wisconson, July (1998).
“Cataloging Sky Objects Using SKICAT” U.M. Fayyad, S.G. Djorgovski, and N. Weir. A chapter in Advances in Knowledge Discovery and Data Mining, U.M. Fayyad, G. Piatetsky-Shapiro, P. Smyth, & R. Uthurusamy (Eds.), AAAI/MIT Press (1996).
“The automated analysis, cataloguing, and searching of digital image libraries: a machine learning approach” U. M. Fayyad and P. Smyth, in Advances in Digital Libraries, N. R. Adam and B. Bhargava (eds.), Lectures Notes in Computer Science, Springer-Verlag, pp.225-249, (1995).
The Automated Analysis, Cataloging, and Searching of Digital Image Libraries: A Machine Learning Approach” U.M. Fayyad & P. Smyth. A chapter in Digital Libraries, N.R. Adam, B. Bhargava & Y. Yesha (Eds.), Lecture Notes in Computer Science 916, pp. 225-249, Berlin–Heidelberg: Springer Verlag (1995).
“Knowledge Discovery in Large Image Databases: Dealing with Uncertainties in Ground Truth” P. Smyth, M.C. Burl, U.M. Fayyad & P. Perona. A chapter in Advances in Knowledge Discovery and Data Mining, U.M. Fayyad, G. Piatetsky-Shapiro, P. Smyth, & R. Uthurusamy (Eds.), AAAI/MIT Press (1995).
“A Machine Learning Approach to Diagnosis and Control with Applications in Semiconductor Manufacturing” K.B. Irani, J. Cheng, U.M. Fayyad, & Z. Qian. A chapter in Intelligent Modeling, Diagnosis, and Control of Manufacturing Processes, B. Chu & S. Chen (Eds.) World Scientific Publishing (1992).
“Sensor Selection in Complex System Monitoring Using Information Quantification and Causal Reasoning” R.J. Doyle, U.M. Fayyad, et al A chapter in Recent Advances in Qualitative Physics, B. Faltings & P. Struss (Eds.) MIT Press, Cambridge, MA (1992).
“A Machine Learning Approach to Diagnosis and Control with Applications in Semiconductor Manufacturing”, K.B. Irani, J. Cheng, U.M. Fayyad, & Z. Qian. A chapter in Intelligent Modeling, Diagnosis, and Control of Manufacturing Processes, B. Chu & S. Chen (Eds.) World Scientific Publishing
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